Signal Recovery offers the best performing most diversified portfolio in the industry. Having over 50 years’ experience, SR has partnered with several manufacturers to provide the most economical solutions without sacrificing performance. We are committed to aiding in a customized solution that will be both profitable and beneficial to any manufacturers total system solution.
Signal Recovery products are commonly used within systems such as:
Photo-elastic modulators (PEM) used in highly sensitive measurements of polarization properties. Birefringence measurement systems measurement of optical retardation and fast axis orientation used in Multi-wavelength and Spectroscopic Measurements, High Speed Scanning package solutions, Low-Level and Multiple Order metrology.
High resolution force and displacement measurements in SEM, FIB, or vacuum chamber used to resolve Nano-indentation, Nano-scale tensile testing, and Nano-mechanical characterization.
Electrical C-V & I-V measurement systems capable of measuring on semiconductor wafers, the contour map showing cross wafer variations.
Scanning Vibrating Electrode Techniques (SVET) operate with a non-intrusive scanning, vibrating probe measuring and mapping the electric field generated in a plane above a surface of an electrochemically active sample.
Scanning Kelvin Probe Techniques (SKP) using a non-contact, non-destructive instrument designed to measure the surface work function difference between conducting, coated, and semi-conducting materials.
Localized Electrochemical Impedance Systems (LEIS) allow spatially resolved impedance measurements to be made above a surface of an electrochemically active sample.
Time of Flight/ Mass Spectrometry (TOF/MS) applications, used in liquid or gas chromatographic separation experiments.